Travis Fullem: search on Z-Library

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1

A Simple Implementation of an Electromagnetic Coilgun Using a Camera Flash Circuit

Fullem, Travis Z., Benedict, Michael S.

Journal:

The Physcis Teacher

Year:

2009

Language:

english

File:

PDF, 1.86 MB

english, 2009

2

Pyroelectric crystal neutron production in a portable prototype vacuum system

Don Gillich, Andrew Kovanen, Bryan Herman, Travis Fullem, Yaron Danon

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

2009

Language:

english

File:

PDF, 446 KB

english, 2009

3

Enhanced pyroelectric crystal D–D nuclear fusion using tungsten nanorods

Donald J. Gillich, Ranganath Teki, Travis Z. Fullem, Andrew Kovanen, Ezekiel Blain, Douglas B. Chrisey, Toh-Ming Lu, Yaron Danon

Journal:

Year:

2009

Language:

english

File:

PDF, 1.15 MB

english, 2009

4

[IEEE 2014 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2014) - Paris, France (2014.7.14-2014.7.18)] 2014 IEEE Radiation Effects Data Workshop (REDW) - Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices

Tostanoski, Michael J., Deaton, Terrence F., Strayer, Roy E., Goldflam, Rudolf, Fullem, Travis Z.

Year:

2014

Language:

english

File:

PDF, 979 KB

english, 2014

5

Thermal Conductivity of Thermal Interface Materials

Fullem, Travis Z., Cotts, Eric J.

Journal:

MRS Proceedings

Year:

2007

Language:

english

File:

PDF, 366 KB

english, 2007

6

[IEEE 2007 IEEE Nuclear Science Symposium Conference Record - Honolulu, HI, USA (2007.10.26-2007.11.3)] 2007 IEEE Nuclear Science Symposium Conference Record - Examination of the utility of commercial-off-the-shelf memory devices as X-ray detectors

Fullem, Travis Z., Lehman, Lawrence P., Cotts, Eric J.

Year:

2007

Language:

english

File:

PDF, 666 KB

english, 2007

7

[IEEE 2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC): Radiation Effects Data Workshop (REDW) - New Orleans, LA (2017.7.17-2017.7.21)] 2017 IEEE Radiation Effects Data Workshop (REDW) - Neutron Induced Single Event Upset (SEU) Testing of Commercial Memory Devices with Embedded Error Correction Codes (ECC)

Bird, John M., Peters, Michael K., Fullem, Travis Z., Tostanoski, Michael J., Deaton, Terrence F., Hartojo, Kristianto, Strayer, Roy E.

Year:

2017

Language:

english

File:

PDF, 559 KB

english, 2017

8

[IEEE 2019 IEEE Radiation Effects Data Workshop (IEEE) (in conjunction with NSREC 2019) - San Antonio, TX, USA (2019.7.8-2019.7.12)] 2019 IEEE Radiation Effects Data Workshop - Neutron Induced Single Event Upset (SEU) Testing of Commercial Flash Memory Devices with and without Embedded Error Correction Codes (ECC)

Allenspach, Mark, Peters, Michael K., Bird, John M., Fullem, Travis Z., Tostanoski, Michael J., Deaton, Terrence F., Hartojo, Kristianto, Strayer, Roy E.

Year:

2019

Language:

english

File:

PDF, 2.39 MB

english, 2019

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